Precision·Stability·Efficiency | Zero Drift·Calibration-Free | Micsig 3rd Generation Optical Isolated Probe Officially Released!

As a pioneer of optical isolated probes in China/domestic market , Micsig has progressed from the first-generation optical isolated probe, which filled a domestic technology gap, to the second-generation optical isolated probe widely adopted in power electronics applications such as photovoltaic inverters, energy storage systems, third-generation semiconductors, industrial power supplies, motor drives, automotive OBCs, and EV charging stations.

Building on its exclusive core technology and comprehensive innovation, Micsig has now officially launched the third-generation optical isolated probe, delivering major breakthroughs in measurement accuracy, user experience, and application adaptability under high-voltage, high-frequency, and strong electromagnetic interference environments.

Full-Band, Full-Range Coverage

The product portfolio includes four models — MOIP200P, MOIP350P, MOIP500P, and MOIP1000P — perfectly suited for demanding test environments involving high frequency, high voltage, and strong electromagnetic radiation, with comprehensive voltage range coverage.

Key Parameter Highlights:

• Bandwidth: DC ~ 1 GHz
• Measurement Voltage: ±0.01V to ±20kV
• Maximum Common-Mode Voltage: 85kV
• Parasitic Input Capacitance: ≤1pF (ultra-low loading effect)
• Common-Mode Rejection Ratio (CMRR): up to 180dB
• Measurement Accuracy: ≤ ±1% within ½ bandwidth
• Drift Characteristics: Zero Drift (ADHOMT technology)
• Calibration: Calibration-free, ready to use on startup
• Interface: Standard BNC, compatible with all oscilloscope brands
• Attenuator: Universal interchangeable, impact-resistant, extended service life

Versatile Customization, Covering Specialized Operating Conditions in One Stop

For demanding and specialized test scenarios — including extreme high/low temperatures, RF high voltage, ultra-high voltage, and micro-signal measurements — the Micsig 3rd generation optical isolated probe offers deeply customized solutions, effortlessly addressing a wide range of non-standard application requirements.

Customization Options:

• Extended-length attenuator, perfectly suited for high/low temperature chamber testing
• Custom probe fiber length, accommodating long-distance isolated measurements
• Custom >110kV ultra-high voltage isolation testing
• Custom >5,000V RF high-voltage testing
• Custom 20kV ultra-high voltage and full-range voltage testing within 20kV

Zero Drift + Calibration-Free, Breaking Through Industry Bottlenecks

Powered by Micsig's proprietary ADHOMT (Analog-Digital Hybrid Optical Modulation Technology), the probe continuously monitors key parameters and dynamically modulates the laser in real time, achieving genuine zero drift and calibration-free operation.

• Ready to use on startup, no warm-up required
• Supports 365-day × 24-hour uninterrupted precision testing
• Thoroughly solves the pain points of temperature drift and frequent recalibration common in conventional optical isolated probes
• Breaks through the bottleneck for efficient, reliable, and continuous testing on power semiconductor packaging and testing production lines

Attenuator Structure Fully Upgraded — Universal, Durable, Cost-Efficient

The newly optimized attenuator structure delivers significantly enhanced resistance to wear and impact, making it less prone to damage under prolonged high-load testing and reducing maintenance costs.

Attenuators of the same model are universally interchangeable and not locked to a specific main unit, maximizing equipment utilization and enabling rapid switching across multiple test stations, greatly improving overall testing efficiency.

Superior Amplitude-Frequency Characteristics for True Full-Band Signal Reproduction

Excellent amplitude-frequency response is fundamental to measurement accuracy. The Micsig 3rd generation optical isolated probe achieves ≤1% measurement accuracy within ½ bandwidth, breaking the conventional ⅕-bandwidth testing rule — which traditionally holds that measurement accuracy beyond ⅕ of the instrument's bandwidth is only for rough reference. It captures full-band signals with precision while suppressing distortion, faithfully reproducing real waveforms.

This fully meets the high-precision, high-bandwidth testing demands in third-generation semiconductors (SiC/GaN), new energy electronic controls, and related fields, providing reliable data support.

Comprehensively Upgraded Cooling for Long-Term Stable Operation

Optimized cooling structure and fan design deliver a twofold improvement in heat dissipation efficiency, enabling prolonged high-load continuous testing without interruption due to overheating. This safeguards test continuity while further reducing operational and maintenance costs.