SigOFIT Gen 3 Optical-fiber Isolated Probe
MOIP Series
Bandwidth：200MHz-350MHz
Common Mode Voltage：85kVpk
DC Accuracy：1%
CMRR：up to 180dB
Interface: BNC
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The third-generation Micsig SigOFIT™ optical isolated probe, MOIP Series, offers a bandwidth range from 200 MHz to 350 MHz, enabling differential measurements from ±0.01 V up to ±20 kV. Built on Micsig’s exclusive SigOFIT™ leading technology, MOIP Series delivers an exceptionally high CMRR, reaching up to 128 dB at 100 MHz, with an isolation voltage of up to 85 kV and an ultra-low noise floor of less than 0.3 mVrms. It reveals the complete truth of signals across its bandwidth range, serving as the ultimate referee for verifying the fidelity of signals measured by other voltage probes.
Present True Signal
SigOFIT probe has highest common mode rejection ratio, or CMRR, up to 128dB at 100MHz, over 100dB at 1GHz. It's the ultimate referee of signal fidelity measured by other voltage probes.
_1776237877.png)
Calibration-free during testing
Real-time optical power compensation ensures continuous high-fidelity waveform output in complex 24/7 measurement environments, with no manual calibration required.
Highest Accuracy
As the ultimate referee of signal fidelity, SigOFIT optical-fiber isolated probe delivers highest test accuracy. It has excellent amplitude-frequency characteristics, DC gain accuracy ≤1%, while noise ≤ 0.3mVrms. Zero drift<0.1% (works 5 mins later), gain drift also <1%.
Best Probe for Third-Gen Semiconductor
SiC & GaN device can switch high voltages in a few nanoseconds, the signal may have high-energy high-frequency harmonics.
Even at the highest bandwidth, the SigOFIT probe still have nearly 100dB CMRR, perfectly suppressed the oscillation caused by high-frequency common-mode noise, no redundant components. It's the best choice for 3rd-gen semiconductor test & measurement.
Safe to Test GaN
The test leads of SigOFIT probe are short and with coaxial cable transmission, the input capacitance is as low as 1pF minimum, very safe to test GaN.
Real Optical Isolation Technology
Lasers transmit signals + Power over fiber (no batteries needed, the power supply is more pure), realizes continuous test for 365 days.
Wide Measurement Range
Unlike traditional differential probes can only test high-voltage signals, SigOFIT probe can be used with different attenuator tips to test differential mode signals from ±0.01V to ±20kV, achieve full-range output and very high signal-to-noise ratio.
Efficient & Affordable
Fastest response, can be tested immediately after power-on; AutoZero completed in less than 1 second, ensures accurate signal output in real time.
Applications
* Design of motor drive, power converter, electronic ballast
* Design of GaN, SiC, IGBT Half/Full bridge devices
* Design of inverter, UPS and switching power supply
* Safety test for high voltage, high bandwidth applications
* Power device evaluation
* Current shunt measurements
* EMI & ESD troubleshooting
* Floating measurements
The third-generation Micsig SigOFIT™ optical isolated probe, MOIP Series, offers a bandwidth range from 200 MHz to 350 MHz, enabling differential measurements from ±0.01 V up to ±20 kV. Built on Micsig’s exclusive SigOFIT™ leading technology, MOIP Series delivers an exceptionally high CMRR, reaching up to 128 dB at 100 MHz, with an isolation voltage of up to 85 kV and an ultra-low noise floor of less than 0.3 mVrms. It reveals the complete truth of signals across its bandwidth range, serving as the ultimate referee for verifying the fidelity of signals measured by other voltage probes.
Present True Signal
SigOFIT probe has highest common mode rejection ratio, or CMRR, up to 128dB at 100MHz, over 100dB at 1GHz. It's the ultimate referee of signal fidelity measured by other voltage probes.
_1776237877.png)
Calibration-Free Throughout the Entire Test Process
Real-time optical power compensation ensures continuous high-fidelity waveform output in complex 24/7 measurement environments, with no manual calibration required.
Highest Accuracy
As the ultimate referee of signal fidelity, SigOFIT optical-fiber isolated probe delivers highest test accuracy. It has excellent amplitude-frequency characteristics, DC gain accuracy ≤1%, while noise ≤ 0.3mVrms. Zero drift<0.1% (works 5 mins later), gain drift also <1%.
Best Probe for Third-Gen Semiconductor
SiC & GaN device can switch high voltages in a few nanoseconds, the signal may have high-energy high-frequency harmonics.
Even at the highest bandwidth, the SigOFIT probe still have nearly 100dB CMRR, perfectly suppressed the oscillation caused by high-frequency common-mode noise, no redundant components. It's the best choice for 3rd-gen semiconductor test & measurement.
Safe to Test GaN
The test leads of SigOFIT probe are short and with coaxial cable transmission, the input capacitance is as low as 1pF minimum, very safe to test GaN.
Wide Measurement Range
Unlike traditional differential probes can only test high-voltage signals, SigOFIT probe can be used with different attenuator tips to test differential mode signals from ±0.01V to ±6250V, achieve full-range output and very high signal-to-noise ratio.
_1776237759.png)
Efficient & Affordable
Fastest response, can be tested immediately after power-on; AutoZero completed in less than 1 second, ensures accurate signal output in real time.
Applications
* Design of motor drive, power converter, electronic ballast
* Design of GaN, SiC, IGBT Half/Full bridge devices
* Design of inverter, UPS and switching power supply
* Safety test for high voltage, high bandwidth applications
* Power device evaluation
* Current shunt measurements
* EMI & ESD troubleshooting
* Floating measurements
Key Specifications
Key Specifications
