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The "Three Workhorses" of Power Device Current Measurement: Rogowski Coil vs. Coaxial Shunt vs. High-Frequency Current Probe
In the SiC/GaN era, nanosecond switching and kilo-amp currents make current measurement the bottleneck of power semiconductor testing. This article compares three mainstream approaches — the Rogowski coil (no magnetic saturation, ideal for kilo-amp transients), the coaxial shunt (the 0.1% accuracy benchmark), and the high-frequency AC/DC current probe (clamp-on versatility) — covering their principles, strengths, limitations, and use cases. It provides selection guidance for six typical scenarios and recommends a complete Micsig measurement chain: RCP + CP + MOIP + MHO6.
2026-09-02
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High-Speed Power Testing in the AI Computing Era: Micsig SigOFIT™ MOIP Optical-Fiber Isolated Probes for Data Center Power and Power Semiconductor Testing
As AI computing surges, data center power systems are moving toward higher power density, greater efficiency, and faster dynamic response. The high-speed switching of wide-bandgap semiconductors such as SiC and GaN introduces measurement challenges including high common-mode voltage, high dv/dt, and fast switching edges. Built on an electrical-optical-electrical isolation architecture with ADHOMT analog-digital hybrid optical modulation technology, the Micsig SigOFIT™ third-generation MOIP series optically isolated probes deliver 200 MHz–1.2 GHz bandwidth, a CMRR of up to 108 dB at 1 GHz, input capacitance as low as 1 pF, automatic calibration, and flexible attenuator configuration — providing a professional measurement solution for AI power systems and SiC/GaN power semiconductor testing.
2026-09-02
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One Article to know High-Resolution Modular Oscilloscope MO3 Series
Micsig MO3 series high-resolution modular oscilloscope: 12-bit ADC, ≤85 μVrms noise floor, 360 Mpts deep memory, and a 30 mm slim chassis with multi-unit synchronization up to 128 channels. Built-in decoding for CAN, SPI, I²C, 1553B and more, with HDMI direct output and SCPI/API support — ideal for power ripple, power electronics, embedded bus, and automated test applications.
2026-09-02
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Exhibition Highlights | Micsig Wraps Up a Successful Appearance at PCIM Asia Shenzhen 2026
2026-08-28
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Micsig Third-Generation Optical-fiber Isolated Probe MOIP Series Wins “Outstanding Technology Innovation Product” Award
2026-07-08
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One Article to Know Rogowski AC Current Probe RCP Series
One Article to Know Rogowski AC Current Probe RCP Series Micsig Rogowski AC Current Probe RCP Series is designed for high-frequency, high-current and high-voltage isolated measurement scenarios. This lineup consists of four sub-series: XS, S, M and L, with abundant customization options. It achieves a bandwidth up to 100 MHz and a maximum measurable current of 12000 Apk, with a typical accuracy of 2%. The probe can precisely capture high-frequency high-current signals, and is widely applied to double-pulse dynamic tests as well as real-time monitoring and analysis of AC current waveforms for wide-bandgap power semiconductors including SiC, GaN and IGBTs.
2026-07-08
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One Article to Understand the Micsig AHO1 Series High-Resolution Automotive Oscilloscope
The Micsig AHO1 Series is a high-resolution automotive oscilloscope purpose-built for automotive electronic control system diagnostics. Featuring 200MHz bandwidth, 4 channels, 1GSa/s real-time sampling rate, and a 12-bit vertical resolution as its core highlight, it can clearly capture millivolt-level signals. It integrates a 4⅚-digit multimeter, presets full-scene automotive diagnostic functions including charging/starting circuits, sensors, actuators, ignition circuits, and communication buses, and adopts a dual-software architecture combining automotive-specific and general-purpose oscilloscope modes. With an ultra-thin 3.1cm body and a large-capacity lithium battery, it is an ideal choice for maintenance, R&D, and teaching for both traditional fuel vehicles and new energy vehicles.
2026-07-08
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