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From November 6 to 10, 2025, the Fourth China Power Electronics and Energy Conversion Conference and Exhibition (CPEEC), the 28th Annual Academic Conference of the China Power Supply Society (CPSSC 2025), and the finals of the 11th University-Level Power Electronics Application Design Competition were held at the Shenzhen International Convention & Exhibition Center.

This event brought together academic exchanges, technological demonstrations, and talent development, attracting more than 5,000 participants, including experts and scholars, corporate representatives, and faculty and students from universities across the country. As one of the conference’s partner companies, Maikexin Technology organized a series of activities during the event.

1

Supporting university competitions and promoting industry–university–research collaboration.

As the platinum partner of this year’s University Power Electronics Application Design Competition, Micro‑Sense Technology provided a full range of products and technical support, underscoring its commitment to industry–university–research collaboration and talent development. Initiated by the China Power Supply Society in 2015, the competition is an exploratory engineering‑practice initiative open to students from universities nationwide. Over the years, it has grown into one of the most influential university‑level contests in the field of power electronics across China.

2

Showcase in-house products and exchange technical solutions.

At the exhibition, Micro‑Xin Technology showcased its full range of oscilloscopes and probes, drawing numerous industry professionals to stop by and engage in discussions. At the booth, the company’s technical team exchanged insights with visiting engineers, academics, and corporate representatives on real‑world R&D challenges and emerging industry trends. Through product demonstrations and detailed performance explanations, attendees gained a deeper understanding of how Micro‑Xin Technology’s offerings address key user pain points while delivering exceptional accuracy and reliability.

3

Sharing testing techniques and discussing industry challenges.

During the keynote session, Wang Guanqun, Product Director at Micro‑Sense Technology, delivered a presentation titled “Seeking Light at Grain Boundaries: An Analysis of Challenges in Testing Wide‑Bandgap Semiconductor Devices and Pathways to Overcome Them.” The talk focused on the critical issues faced by wide‑bandgap semiconductor devices—such as GaN and SiC—in high‑speed, high‑voltage testing, and, drawing on real‑world test cases, shared Micro‑Sense’s practical experience and insights into relevant testing methodologies and technical approaches. The audience engaged in lively Q&A with the speaker.

Though the grand event has come to a close, innovation never stops. MakoXin Technology will remain committed to R&D in the field of power electronics testing and measurement, working hand in hand with the industry to advance energy conversion technologies.