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A Successful Wrap-Up | Micsig at CPEEC & CPSSC 2026

Release Time:2026-11-10

Micsig wrapped up a successful appearance at CPEEC & CPSSC 2026 in Suzhou, showcasing MHO6/MHO3 high-resolution oscilloscopes, MOIP optical isolation probes, DP high-voltage differential probes and CP current probes at Booth E13, Hall B1, and delivering a well-received forum talk on measurement challenges in SiC MOSFET double-pulse testing.

From November 5 to 8, 2026, the 5th China Power Electronics and Energy Conversion Conference and Exhibition (CPEEC 2026) and the 29th Annual Conference of the China Power Supply Society (CPSSC 2026), both hosted by the China Power Supply Society, were held at the Suzhou International Expo Center, with the technical exhibition open to visitors on November 6-7. The event has now come to a successful close. Bringing together academic symposia, technology showcases, and industry exchange under one roof, it attracted experts, scholars, and engineers from universities, research institutes, and companies across China. Micsig presented its full lineup of test and measurement instruments at Booth E13, Hall B1, connecting with industry peers on the latest trends in power electronics.

 

 

01 Live from the Show Floor · A Hub of Insight

The Micsig booth buzzed with activity throughout the show. Star products on display included the MHO6 and MHO3 high-resolution oscilloscopes, the MOIP series optical isolation probes, the DP series high-voltage differential probes, and the CP series high-frequency AC/DC current probes. Our engineers connected face to face with visiting engineers, faculty and students, and corporate delegates, engaging in in-depth discussions on real-world test challenges in wide-bandgap (WBG) semiconductor device testing and power-device double-pulse testing, as well as product accuracy and reliability. Visitors were also treated to hand-brewed coffee at the booth, making technical exchanges all the more relaxed and enjoyable.


02 On the Forum Stage · Insights from Practice

On the afternoon of November 7, a Micsig technical expert took the stage at the exhibitor forum with a presentation titled "SiC MOSFET Double-Pulse Testing — Measurement Challenges." Rooted in front-line experience with wide-bandgap device testing, the talk moved step by step from defining and interpreting key test parameters, to building and selecting measurement setups, to reviewing real-world case studies — systematically unpacking the technical essentials and engineering practices of double-pulse testing and offering a clear path toward accurate measurement in the wide-bandgap era. The presentation struck a strong chord with the engineers in the audience.

 

03 A Successful Close · Onward to New Horizons

Tides rise in the East; energy surges toward the future. The four-day CPEEC & CPSSC 2026 has drawn to a successful close at the Suzhou International Expo Center. Uniting conference sessions, exhibitions, competitions, and awards in a single event, it gathered the collective wisdom of academia, industry, and research across the power electronics and power supply communities.

As AI data-center power architectures evolve at full speed and wide-bandgap semiconductors race toward large-scale adoption, power electronics is entering a new era of higher voltages and faster switching — pushing test and measurement to the very frontier of the challenge. Micsig will continue to stand with the industry, answering the demands of the times with sustained technological innovation and providing solid, dependable measurement support for every leap forward in power electronics.

All meetings must end, but the journey continues. Our heartfelt thanks go to every friend, old and new, who stopped by our booth — see you at the next industry gathering!


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