SigOFIT Gen 3 Optical-fiber Isolated Probe
MOIP Series

The third-generation Micsig SigOFIT™ optical-fiber isolated probe, MOIP Series, offers a bandwidth range from 200 MHz to 1.2 GHz, enabling differential measurements from ±0.01 V up to ±20 kV. Built on Micsig’s exclusive SigOFIT™ leading technology, MOIP Series delivers an exceptionally high CMRR, reaching up to 128 dB at 100 MHz, with an isolation voltage of up to 85 kV and the minimum noise floor is as low as 0.3 mVrms. It reveals the complete truth of signals across its bandwidth range, serving as the ultimate referee for verifying the fidelity of signals measured by other voltage probes.

Present True Signal

The SigOFIT optically isolated probe features an exceptionally high common-mode rejection ratio (CMRR), reaching 122 dB at 200 MHz and still maintaining 106 dB at 1.2 GHz. It serves as the ultimate benchmark for verifying the signal fidelity captured by other voltage probes.

Calibration-free During Testing

Real-time optical power compensation ensures continuous high-fidelity waveform output in complex 24/7 measurement environments, with no manual calibration required.

Highest Accuracy

As the ultimate referee of signal fidelity, the SigOFIT™ optical-fiber isolated probe delivers the highest measurement accuracy. It offers excellent amplitude–frequency characteristics with DC gain accuracy of ≤1% and a minimum noise floor as low as 0.3 mVrms. With zero drift and gain drift of <1%, it is ready to measure immediately at power-on — no warm-up, no manual calibration.

Best Probe for Third-Gen Semiconductor

SiC and GaN devices can switch high voltages within a few nanoseconds, and their signals may contain high-energy, high-frequency harmonics. Even at the highest bandwidth, the SigOFIT™ probe still delivers nearly 100 dB of CMRR, effectively suppressing the ringing caused by high-frequency common-mode noise and leaving no redundant components. It is the best choice for third-generation semiconductor test and measurement.

Safe to Test GaN

The SigOFIT™ probe features short test leads and coaxial transmission, with input capacitance as low as 1 pF, making it very safe for testing GaN devices.

Real Optical Isolation Technology

Lasers transmit both the signal and the power over fiber — no batteries are needed, so the power supply is cleaner — enabling continuous 24/7 testing.

Wide Measurement Range

Unlike traditional differential probes, which can only measure high-voltage signals, the SigOFIT™ probe works with a range of attenuator tips to measure differential-mode signals from ±0.01 V to ±20 kV, achieving full-range output and a very high signal-to-noise ratio.

Efficient & Affordable

With the fastest response, it is ready to measure immediately after power-on; AutoZero completes in less than one second, ensuring accurate real-time signal output.

Applications

* Design of motor drive, power converter, electronic ballast
* Design of GaN, SiC, IGBT Half/Full bridge devices
* Design of inverter, UPS and switching power supply
* Safety test for high voltage, high bandwidth applications
* Power device evaluation
* Current shunt measurements
* EMI & ESD troubleshooting
* Floating measurements